Publication
644
ChemPhysChem
10, 1053-1057, 2009.
DOI:
10.1002/cphc.200800803
|
|
|
|
|
|
Localized electrografting of vinylic monomers on a conducting substrate by means of an integrated electrochemical AFM probe |
|
|
|
|
|
Achraf Ghorbal , Dr. 1 3,
Federico Grisotto 1, Julienne
Charlier, Dr. 1
*, Serge Palacin, Dr.
1, Cédric Goyer, Dr. 2,
Christophe Demaille, Dr. 2
1DSM/IRAMIS/SPCSI, Laboratoire
de Chimie des Surfaces et des Interfaces, CEA -Saclay, 91191
Gif-sur-Yvette (France) 2Université Paris Diderot - Paris 7, UMR CNRS
7591, 15, rue Jean-Antoine de Baïf, 75013 Paris Cedex 13
(France) 3Current address:
Laboratoire de physique et chimie des interfaces Avenue de
l'environnement 5019 Monastir (Tunisia)
An electrochemical lithographic tool for locally electrografting a non-conducting organic coating on a conducting substrate with a submicrometer resolution is provided by atomic force scanning electrochemical microscopy (AFM-SECM). The picture shows the topographic AFM image of the line pattern drawn with an AFM-SECM tip on a gold surface by direct reduction of an aryl diazonium salt/acrylic acid electrolyte solution.Combinations of scanning electrochemical microscopy (SECM) with other scanning probe microscopy techniques, such as atomic force microscopy (AFM), show great promise for directing localized modification, which is of great interest for chemical, biochemical and technical applications. Herein, an atomic force scanning electrochemical microscope is used as a new electrochemical lithographic tool (L-AFM-SECM) to locally electrograft, with submicrometer resolution, a non-conducting organic coating on a conducting substrate. |